| 研究計畫 | ||||
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研究計畫 |
| 排序: |
| 計畫名稱 | 主持教授 | 預算 | 執行時間 |
| 網路通訊國家型科技計畫研究發展及推動規劃(1/3) NSC 99-2219-E-002-022- |
蔡志宏 | 1347000 | 2010-01-01 - 2011-02-28 |
| 資訊與通訊科技發展計畫探討及審議研究 NSC 99-3011-P-002-004 |
蔡志宏 | 868000 | 2010-01-01 - 2010-12-31 |
| 下世代無線網路頻譜共享模型與機制之基礎研究-子計畫一:大型無線網路與虛擬業者協同頻率共享機制之效能分析(3/3) NSC 99-2219-E-002-002 |
蔡志宏 | 1177000 | 2010-08-01 - 2010-07-31 |
| 網路通訊國家型科技計畫研究發展及推動規劃(2/3) NSC 100-2219-E-002 -013 |
蔡志宏 | 1361000 | 2011-01-01 - 2011-12-31 |
| 以活動量為基礎之接取網路省電設計與優化研究 NSC 100-2221-E-002-186-MY2 |
蔡志宏 | 1462000 | 2011-08-01 - 2013-07-01 |
| 行動寬頻頻譜政策之研究與規劃 MOST 103-3011-P-002 -008 |
蔡志宏 | 1287000 | 2014-07-01 - 2015-06-30 |
| 下世代行動通訊網路裝置聯網關鍵技術之基礎研究 MOST 103-2221-E-002-024-MY2 |
蔡志宏 | 1708000 | 2014-08-01 - 2016-07-31 |
| 下世代行動寬頻頻譜發展趨勢之研究 MOST 104-3011-F-002-007 |
蔡志宏 | 1685000 | 2015-07-01 - 2016-06-30 |
| 下世代行動寬頻暨物聯網車聯網通訊頻譜趨勢之研究 MOST 105-3011-F-002-007- |
蔡志宏 | 1490000 | 2016-07-01 - 2017-06-30 |
| 多頻物聯網網狀網路節能關鍵技術之研究 MOST 105-2221-E-002-060- |
蔡志宏 | 761000 | 2016-08-01 - 2017-07-31 |
| Apply Control and Optimization Techniques to Improve OPC Convergence with Design Intent 95E1058 |
蔡坤諭 | 850000 | 2006-01-01 - 2006-12-01 |
| 適用32奈米以下製程之高產能、低成本平行寫入無光罩微影技術初步研究 NSC-95-2218-E-002-045 |
蔡坤諭 | 504000 | 2006-02-01 - 2006-10-01 |
| Design, Manufacturing, and Testing (DMT) for Sub-wavelength ULSI Rapid Yield Ramp Phase I: Scoping and Roadmap Planning. Task 2: Manufacturing for Design: Linking Subwavelength Lithography Process and Design Intent for Yield Improvement 95FSB07 |
蔡坤諭 | 931500 | 2006-05-01 - 2006-10-01 |
| 基於微機電系統技術之高產能多電子束平行寫入微影系統之研發 95R0110-03 |
蔡坤諭 | 8570000 | 2006-08-01 - 2008-07-01 |
| 深次微米IC設計,製造,與測試之半導體工程鏈研究--子計畫三:最佳化整合設計、製造和測試以提升大型積體電路的良率與性能(I) NSC-95-2221-E-002-436 |
蔡坤諭 | 498000 | 2006-08-01 - 2007-07-01 |
| 多電子束平行掃瞄微影系統設計--子計畫三:多電子束平行掃瞄系統之電磁透鏡、遮黑板與資料傳輸系統研發(I) NSC-95-2221-E-002-308 |
蔡坤諭 | 658000 | 2006-08-01 - 2007-07-01 |
| 蛇形仿生運動機制及前瞻載具驅動系統之研究-總計畫:蛇形仿生運動機制及前瞻載具驅動系統之研究 NSC-95-2221-E-002-301-MY3 |
蔡坤諭 | 2854677 | 2006-08-01 - 2009-10-01 |
| 深次微米IC設計,製造,與測試之半導體工程鏈研究-總計畫及子計畫五:深次微米IC設計,製造,與測試之半導體工程鏈研究深次微米IC設計,製造,與測試之半導體工程鏈研究-總計畫及子計畫五:深次微米IC設計,製造,與測試之半導體工程鏈研究 NSC-95-2221-E-002-301-MY3 |
蔡坤諭 | 2878000 | 2006-08-01 - 2009-07-01 |
| 多電子束平行掃瞄微影系統設計-子計畫五:多電子束平行掃瞄微影系統之減振控制 NSC-95-2221-E-002-310-MY3 |
蔡坤諭 | 2226000 | 2006-08-01 - 2009-07-01 |
| 教育部前瞻晶片系統設計人才培育先導型計畫-「DAT聯盟超大型積體電路量產可行性設計課程」發展計畫 內容四: 微影模型與製程變動之模擬 95M1146-4 |
蔡坤諭 | 400000 | 2006-09-01 - 2008-01-01 |
| 座艙聲紋分析系統之研發 95-3114-E002 -004- |
蔡坤諭 | 823000 | 2006-11-01 - 2007-10-01 |
| Apply Control and Optimization Techniques to lmprove OPC Convergence with Design Intent-Phase II 96E1014 |
蔡坤諭 | 700000 | 2007-01-01 - 2007-12-01 |
| Manufacturing for Design: Linking Sub-wavelength Lithography Process and Design Intent for Manufacturability Improvement – Phase II - Subtask B: Demonstration of Efficient Data Flow for Foundry-Design House Interaction 96FSB10 |
蔡坤諭 | 975000 | 2007-01-25 - 2007-12-07 |
| Manufacturing for Design: Linking Sub-wavelength Lithography Process and Design Intent for Manufacturability Improvement - Phase II - Subtask A: Circuit modeling related to process-induced non-ideal patterning 96FSB09 |
蔡坤諭 | 975000 | 2007-01-25 - 2007-12-07 |
| 精密光學技術-應用於數位成像系統 -- 子計畫二: 運用運動學式鏡片裝配技術於光學微影曝光機像差控制與成像品質最佳化之分析 96E1014 |
蔡坤諭 | 320000 | 2007-05-25 - 2007-12-21 |
| 多電子束平行掃瞄微影系統設計--子計畫三:多電子束平行掃瞄系統之電磁透鏡、遮黑板與資料傳輸系統研發(II) NSC-96-2221-E-002-274 |
蔡坤諭 | 553000 | 2007-08-01 - 2008-07-31 |
| Modeling Proximity-Effects for E-beam Direct-Write Lithography at 22-nm Half-Pitch Node and beyond 97E3130 |
蔡坤諭 | 750000 | 2008-01-01 - 2008-12-01 |
| Manufacturing for Design: Linking Sub-wavelength Lithography Process and Design Intent for Manufacturability Improvement – Phase III - Subtask B: Lithography-aware Pattern Library and Assist Feature Insertion for CMP/OPC 97-FS-15 |
蔡坤諭 | 966000 | 2008-01-01 - 2008-11-01 |
| Manufacturing for Design: Linking Sub-wavelength Lithography Process and Design Intent for Manufacturability Improvement – Phase III - Subtask A: Lithography-aware Interconnect Parasitics Extraction - RC extraction for single layer 97-FS-14 |
蔡坤諭 | 966000 | 2008-01-01 - 2008-12-01 |
| Scatterometry-Related CD Metrology for 45-nm Half-Pitch Node and Beyond - Phase I - Part (A): Rigorous Simulation of EUV Phase-Shift Masks for 32-nm Half-Pitch Node and Beyond 97-S-C35 |
蔡坤諭 | 1148175 | 2008-04-01 - 2009-03-01 |
| Scatterometry-Related CD Metrology for 45-nm Half-Pitch Node and Beyond - Phase I - Part (B): Rigorous Simulation of CD-Calibration Samples 97-S-C36 |
蔡坤諭 | 1148175 | 2008-04-01 - 2009-03-01 |
| Scatterometry-Related CD Metrology for 45-nm Half-Pitch Node and Beyond - Phase I - Part (C): Fabrication and Metrology of CD-Calibration Samples 97-S-C37 |
蔡坤諭 | 1102102 | 2008-04-01 - 2009-03-01 |
| 極紫外光微影技術從光源建造、光罩、材料、製程到奈米元件可靠度研究(1/3) 97-2120-M-009-007 |
蔡坤諭 | 6800000 | 2008-08-01 - 2009-07-01 |
| 基於微機電系統技術之高產能多電子束平行寫入微影系統及製程技術之研發(1/2) 97-2622-E-002-012-CC1 |
蔡坤諭 | 28612000 | 2008-08-01 - 2009-10-01 |
| 多電子束平行掃瞄微影系統設計-子計畫一:多電子束平行掃瞄系統之電磁透鏡、遮黑板與資料傳輸系統研發(III) NSC-97-2221-E-002-209 |
蔡坤諭 | 798000 | 2008-08-01 - 2009-07-01 |
| 次32奈米多重曝光微影專用光學鄰近修正演算法之前瞻研究 97R0330 |
蔡坤諭 | 1000000 | 2008-08-01 - 2009-07-01 |
| 適用於微投影模組之雷射光斑抑制抑制技術研發 98-S-C10 |
蔡坤諭 | 497700 | 2009-03-01 - 2010-03-01 |
| Non-ProtoBar Optical Proximity Correction 98-S-C37 |
蔡坤諭 | 776160 | 2009-05-01 - 2010-04-01 |
| 極紫外光(EUV)微影技術從光源建造、光罩、材料、製程到奈米元件可靠度研究(2/3) 98-2120-M-009-007 |
蔡坤諭 | 6800000 | 2009-08-01 - 2010-07-01 |
| 基於微機電系統技術之高產能多電子束平行寫入微影系統及製程技術之研發(2/2) 98-2622-E-002-003-CC1 |
蔡坤諭 | 26848000 | 2009-08-01 - 2010-07-01 |
| 次32奈米半間距微影製程考慮多重曝光之光罩設計自動化研究 98-2221-E-002-118-MY3 |
蔡坤諭 | 2659000 | 2009-08-01 - 2012-07-01 |
| 以波帶片陣列為基礎之極紫外光直寫微影系統之研發-總計畫:以波帶片陣列為基礎之極紫外光直寫微影系統之研發 NSC-98-2221-E-002-164-MY3 |
蔡坤諭 | 7435000 | 2009-08-01 - 2012-07-01 |
| 應用於自動化光學檢測系統之高性能運算與數位訊號處理技術之研發 98R0101 |
蔡坤諭 | 1312500 | 2009-08-01 - 2010-07-01 |
| Exposure and Resist Models for Electron-Beam-Direct-Write 98-S-C54 |
蔡坤諭 | 804975 | 2009-10-15 - 2010-10-14 |
| Scatterometry-Related CD Metrology for 45-nm Half-Pitch Node and Beyond - Phase II - Part (B): Fabrication and Metrology of CD-Calibration Samples 99-S-C08 |
蔡坤諭 | 1852767 | 2010-01-01 - 2010-12-01 |
| Scatterometry-Related CD Metrology for 45-nm Half-Pitch Node and Beyond - Phase II - Part (A): Rigorous Simulation of CD-Calibration Samples 99-S-C07 |
蔡坤諭 | 1028160 | 2010-01-01 - 2010-12-01 |
| 極紫外光(EUV)微影技術從光源建造、光罩、材料、製程到奈米元件可靠度研究(3/3) 99-2120-M-009-004 |
蔡坤諭 | 4800000 | 2010-08-01 - 2011-07-01 |
| 針對次22奈米技術之前瞻電子設計自動化研究-子計畫四:針對次22奈米技術之良率導向與可靠度設計 99-2221-E-002-216-MY3 |
蔡坤諭 | 2178000 | 2010-08-01 - 2013-07-01 |
| 考慮次波長製程效應與其電性影響之積體電路佈局優化技術研發 99R70408 |
蔡坤諭 | 982000 | 2010-08-01 - 2011-07-01 |
| Study of Etch Modeling for Accurate Optical Proximity Correction 98-S-C51 |
蔡坤諭 | 804975 | 2010-09-15 - 2011-10-14 |